IMS3TW 2012 - Call for Participation

Advance Discount Registration Deadline April 23rd, 2012!

CALL FOR PARTICIPATION

Scope -- Key Dates -- Venue -- Workshop Registration -- Advance Program -- More Information -- Committees

Scope

IMS3TW aims to bring together a community of researchers working on the next-generation of devices, circuits and systems. This year, IMS3TW will continue to address the traditional technology spectrum of IMSTW, in particular all aspects of analog, mixed-signal, and RF testing, but with increased attention to all aspects of current design complexity (e.g., parametric variability, power consumption, temperature effects). To guaranteeing design robustness for the new generation of nanoelectronic devices, we need to exploit self-monitoring functionality (such as self-test/-calibration), allowing the circuit or system to adapt to varying circuit parameters or functional demands. The sensors focus of the workshop will highlight all aspects of built-in sensors for device adaptation, MEMS, and biomedical applications such as lab-on-chip and implantable devices.

Key Dates

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Advance Discount Registration Deadline: April 23rd, 2012!

The Venue

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The 2012 IMS3TW will be held at Taipei, Taiwan.

Taipei Maps

Taipei city map (jpeg) (pdf)
Taipei night market map
Taipei city cycling map (1) (2)

Workshop Registration

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To register online click here!

Advance Program

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Keynote:A World of Ubiquitous Screening - Recent Development in Flexible Displays
Dr. Janglin (John) Chen
Vice President of ITRI, and General Director of Display Technology Center

Prior to joining ITRI, Dr. Chen was a Research Fellow of Eastman Kodak Company in Rochester, New
York, where he held many R&D managerial positions from 1982 to 2006, and is the author of sixty
technical articles, and 33 issued US Patents. Dr. Chen holds a Ph.D. degree from NYU/Polytechnic
University, New York (1982), and is a graduate of Senior Executive Program, Stanford University, CA.
In ITRI, Dr. Chen and his staff focus on new display and advanced technology research, including
flexible displays, substrates, metal oxide TFT and electrowetting display. Dr. Chen, an Editor-in-Chief
of “Handbook of Visual Display Technology” (Canopus Academic Publishing), and Associate Editor of
IEEE/OSA Journal of Display Technology, presently serves as the Vice Chairman of Taiwan Display
Union Association.

Special Session on Industrial Practices
Organizer: H.-C. Hong, National Chaio-Tung University, Taiwan
S.-H. Su et al., National Chip Implementation Center, Taiwan
R. Looijen and P. Crabbe, Salland Engineering, Netherlands
N. Wu and T.-M. Wang, Accton Technology, Taiwan
O. Ganon and E. Dahan, Intel, Israel

Panel: How Best Can We Deploy Analog/Mixed-Signal DFT Solutions?
Organizer: K. Chakrabarty, Duke University, USA
Moderator: Hans Kerkhoff, Univ Twente, Netherlands

Primary Topics of Interest include:

Test & Design for (on/off-line) Test
Verification & Design for Verification
Reliability & Design for Reliability
Monitoring/Diagnosis & Design for Debug/Diagnosis
Fault and Error Modelling & Simulation
Fault Tolerance

Pertaining to the following systems or underlying technologies:

Analog/Mixed-Signal Circuits
Lab-on-Chip
Biomedical Circuits & Systems
MEMS
RF & Wirelessly Controlled Devices
Microfluidics
Optoelectronics & Photonics
Heterogeneous Systems
Drug Delivery Microsystems
Implantable Devices
Embedded Systems

More Information

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General Information
C.-W. Wu
Information and Communication Research Labs
Industrial Technology Research Institute (ITRI)
Hsinchu 310, Taiwan
Tel: +886-3-5919112
email: cww@itri.org.tw

Program Information
J.-L. Huang
Graduate Institute of Electronics Engineering
National Taiwan University
Taipei 106, Taiwan
Tel: +886-2-3366-3609
email: jlhuang@ntu.edu.tw

Committees

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General Chair
C.-W. Wu, ITRI, Taiwan

Program Committee Chair
J.-L. Huang, NTU, Taiwan

Program Co-Chairs
Signals & Systems:
H. Stratigopoulos, TIMA, France
Sensors:
A. Bermak, HK U. of Sc. and Tech., Hong Kong

Panel Chair
K. Chakrabarty, Duke U., USA

Special Session Chair
H.-C. Hong, NCTU, Taiwan

Publicity Chair
S. Mir, TIMA, France

Publications Chair
F. Azais, LIRMM, France

TTTC Liaison
A. Ivanov, UBC, Canada

Local Arrangements
C.-L. Hsu, ITRI, Taiwan
X.-L. Huang, ITRI, Taiwan

Steering Committee
B. Kaminska (Chair)
F. Azais
A. Chatterjee
K.-T. Cheng
B. Courtois
A. Ivanov
H. Kerkhoff
S. Mir
A. Osseiran
M. Renovell
A. Richardson

Technical Program Committee

J. Abraham, University of Texas, USA
F. Azais, LIRMM, France
K. Arabi, Qualcomm, USA
A. Bermak, HK U. of Sc. And Tech., Hong Kong
S. Bhunia, Case Western Reserve Univ., USA
F. Boussaid, UWA, Australia
S.-J. Chang, NCKU, Taiwan
A. Chatterjee, Georgia Tech., USA
E. Cretu, University of British Columbia, Canada
H.-C. Hong, National ChiaoTung University, Taiwan
H. Kerkhoff, University of Twente, Netherlands
D. Keezer, Georgia Tech., USA
H. Kobayashi, Gunma University, Japan
J. Machado da Silva, University of Porto, Portugal
Y. Makris, Yale University, USA
I. McWalter, CMC MicroSystems, Canada
J. Ohta, Nara Institute of Sc. and Tech., Japan
A. Osseiran, Edith Cowan University, Australia
A. Richardson, Lancaster University, UK
S. Sattler, Erlangen University, Germany
A. L Simonian, NSF, USA
M. Slamani, IBM, USA
H. M. Von Staudt, Dialog Semiconductors, Germany
Y. Xing, NXP, Netherlands

For more information, visit us on the web at: http://bug.ee.ntu.edu.tw/IMS3TW2012/

The 18th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW '12) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).